Pixel circuit, active matrix apparatus and display apparatus

ABSTRACT

A pixel circuit having a function of compensating for characteristic variation of an electro-optical element and threshold voltage variation of a transistor is formed from a reduced number of component elements. The pixel circuit includes an electro-optical element, a holding capacitor, a sampling transistor, a drive transistor, a switching transistor, and first and second detection transistors. The sampling transistor samples and supplies an input signal from a signal line so as to be held into the holding capacitor. The driving transistor drives the electro-optical element with current in response to the held signal potential. The first and second detection transistors supply a threshold voltage of the drive transistor into the holding capacitor in order to cancel an influence of the threshold voltage in advance.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a continuation of application Ser. No. 11/140,199,entitled “Pixel Circuit, Active Matrix Apparatus and Display Apparatus,filed on May 31, 2005, which claims priority under 35 U.S.C. 119 to2004-164681 and 2004-164682, both filed in Japan on Jun. 2, 2004. Theentire contents of these applications are hereby incorporated byreference.

BACKGROUND OF THE INVENTION

This invention relates to a pixel circuit wherein a load elementdisposed for each pixel is driven by current and also to a matrixapparatus wherein a plurality of pixel circuits are disposed in a matrixand particularly to an active matrix apparatus wherein an amount ofcurrent to be supplied to a load element is controlled by an insulatinggate type field effect transistor provided in each pixel circuit. Thepresent invention further relates to a display apparatus of the activematrix type which includes an electro-optical element whose luminance iscontrolled by a value of current such as an organic EL element as a loadelement.

In an image display apparatus such as, for example, a liquid crystaldisplay apparatus, a large number of liquid crystal elements arejuxtaposed in a matrix and the transmission intensity or reflectionintensity of incoming light is controlled for each pixel in response toimage information to be displayed thereby to display an image. Althoughthis similarly applies to an organic EL display apparatus which uses anorganic EL element for a pixel or a like apparatus, different from aliquid crystal element, an organic EL element is a self light emittingelement. Therefore, the organic EL display apparatus is advantageous inthat the image displayed thereon is higher in visibility than that onthe liquid crystal display apparatus, that no backlight is required andthat the responding speed is high. Further, the organic EL displayapparatus is much different from the liquid crystal display apparatus inthat the luminance level (gradation) of each light emitting element isof the current controlled type wherein it can be controlled by the valueof current flowing therethrough.

For the organic EL display apparatus, two different driving methods areavailable including a simple matrix type driving method and an activematrix type driving method similarly to the liquid crystal displayapparatus. The former has a problem that implementation of a displayapparatus of a large size and a high definition is difficult although itis simple in structure. Therefore, development of organic EL displayapparatus which uses the active matrix type driving method is proceedingenergetically. According to the active matrix type driving method,current to flow to a light emitting element in the inside of each pixelcircuit is controlled by an active element (usually a thin filmtransistor: TFT) provided in the pixel circuit.

Organic EL display apparatus of the type described are disclosed, forexample, in Japanese Patent Laid-Open Nos. 2003-255856 and 2003-271095.

FIG. 10 shows a configuration of an exemplary organic EL displayapparatus. Referring to FIG. 10, the display apparatus 100 shownincludes a pixel array section 102 in which pixel circuits (PXLC) 101are arranged in an m×n matrix, a horizontal selector (HSEL) 103, a writescanner (WSCN) 104, and a drive scanner (DSCN) 105. The displayapparatus 100 further includes signal lines DTL101 to DTL10 n for beingselected by the horizontal selector 103 such that a signal based onluminance information is supplied thereto, scanning lines WSL101 toWSL10 m for being selectively driven by the write scanner 104, andscanning lines DSL101 to DSL10 m for being selectively driving by thedrive scanner 105.

FIG. 11 shows an example of a configuration of a pixel circuit shown inFIG. 10. Referring to FIG. 11, the pixel circuit 101 shown is basicallyformed using a thin film field effect transistor (hereinafter referredto as TFT) of the p-channel type. In particular, the pixel circuit 101includes a drive TFT 111, a switching TFT 112, a sampling TFT 115, anorganic EL element 117, and a holding capacitor C111. The pixel circuit101 formed from the elements mentioned is disclosed at an intersectingpoint of a signal line DTL101 with a scanning line WSL101 and a signalline DTL101. The signal line DTL101 is connected to the drain of thesampling TFT 115 while the scanning line WSL101 is connected to the gateof the sampling TFT 115, and the other scanning line DSL101 is connectedto the gate of the switching TFT 112.

The drive TFT 111, switching TFT 112 and organic EL element 117 areconnected in series between a power supply potential Vcc and a groundpotential GND. In particular, the source of the drive TFT 111 isconnected to the power supply potential Vcc, and the cathode of theorganic EL element 117 (light emitting element) is connected to theground potential GND. Since the organic EL element 117 generally has arectifying action, it is represented by a mark of a diode. Meanwhile,the sampling TFT 115 and the holding capacitor C111 are connected to thegate of the drive TFT 111. The gate-source voltage of the drive TFT 111is represented by Vgs.

In operation of the pixel circuit 101, the scanning line WSL101 is firstplaced into a selection condition (here, the low level) and a signal isapplied to the signal line DTL101. Thereupon, the sampling TFT 115 isrendered conducting so that the signal is written into the holdingcapacitor C111. The signal potential written in the holding capacitorC111 acts as the gate potential to the drive TFT 111. Then, the scanningline WSL101 is placed into a non-selection state (here, the high level).Consequently, the signal line DTL101 and the drive TFT 111 areelectrically disconnected from each other. However, the gate potentialVgs of the drive TFT 111 is held stably by the holding capacitor C111.Thereafter, the other scanning line DSL101 is placed into a selectionstate (here, the low level). Consequently, the switching TFT 112 isrendered conducting, and driving current flows from the power supplypotential Vcc toward the ground potential GND through the TFTs 111 and112 and light emitting element 117. Then, when the scanning line DSL101is placed into a non-selection state, the switching TFT 112 is turnedoff, and the driving current does not flow any more. The switching TFT112 is inserted in order to control the time of light emission of thelight emitting element 117.

The current flowing through the TFT 111 and the light emitting element117 has a value corresponding to the gate-source voltage Vgs of thedrive TFT 111, and the light emitting element 117 continues to emitlight with a luminance corresponding to the current value. Suchoperation of selecting the scanning line WSL101 to transmit a signalapplied to the signal line DTL101 to the inside of the pixel circuit 101is hereinafter referred to as “writing”. If writing of a signal isperformed once as described above, then the light emitting element 117continues to emit light with a fixed luminance for a period of timeuntil writing into the organic EL element 117 is performed subsequently.

As described above, the value of current to flow to the light emittingelement 117 is controlled by adjusting the voltage to be applied to thegate of the TFT 111 serving as a drive transistor in response to aninput signal. At this time, since the source of the p-channel drivetransistor 111 is connected to the power supply potential Vcc, the TFT111 normally operates in a saturation region. Consequently, the drivetransistor 111 serves as a current source having a current value givenby the following expression (1):Ids=(½)·μ·(W/L)·Cox·(Vgs−Vth)2  (1)where Ids is the current flowing between the drain-source of thetransistor which operates in a saturation region, μ the mobility, W thechannel width, L the channel length, Cox the gate capacitance, and Vththe threshold value of the transistor. As apparent from the expression(1), in a saturation region of the transistor, the drain current Ids ofthe transistor is controlled by the gate-source voltage Vgs. Since thegate-source voltage Vgs of the drive transistor 111 shown in FIG. 11 isheld fixed, the drive transistor 111 operates as a constant currentsource and can cause the light emitting element 117 to emit light with afixed luminance.

FIG. 12 is a graph illustrating aged deterioration of thecurrent-voltage (I-V) characteristic of an organic EL element. In thegraph, a curve indicated by a solid line represents the characteristicin an initial state, and another curve which is indicated by a brokenline represents the characteristic after aged deterioration. Usually,the I-V characteristic of an organic EL element deteriorates with timeas seen from the graph. However, in the pixel circuit shown in FIG. 11,since the drive transistor is driven by constant current, the draincurrent Ids continues to flow through the organic EL element, and evenif the I-V characteristic of the organic EL element deteriorates, theluminance of emitted light of the organic EL element does notdeteriorate with time.

SUMMARY OF THE INVENTION

While the pixel circuit shown in FIG. 11 is formed using a p-channelTFT, if it can be formed otherwise using an n-channel TFT, then aconventional amorphous silicon (a-Si) process can be applied to TFTproduction. This makes it possible to reduce the cost of a TFTsubstrate, and it is expected to develop a pixel circuit formed using ann-channel TFT.

FIG. 13 is a circuit diagram showing a configuration wherein thep-channel TFTs of the pixel circuit shown in FIG. 11 are replaced byn-channel TFTs. Referring to FIG. 13, the pixel circuit 101 shownincludes n-channel TFTs 111, 112 and 115, a holding capacitor C111 andan organic EL element 117 which is a light emitting element. The TFT 111is a drive transistor, and the TFT 112 is a switching transistor whilethe TFT 115 is a sampling transistor. Further, in FIG. 13, referencecharacter DTL101 denotes a signal line, and reference characters DSL101and WSL101 denote each a scanning line. Further, in the pixel circuit101, the drain of the TFT 111 as a drive transistor is connected to apower supply potential Vcc and the source of the TFT 111 is connected tothe anode of the organic EL element 117 thereby to form a sourcefollower circuit.

FIG. 14 is a timing chart illustrating operation of the pixel circuitshown in FIG. 13. Referring to FIG. 14, if a selection pulse is appliedto the scanning line WSL101, then the sampling TFT 115 is renderedconducting and samples and writes a signal from the signal line DTL101into the holding capacitor C111. Consequently, the gate potential of thedrive TFT 111 is held at the sampled signal potential. This samplingoperation is performed line sequentially. In particular, after aselection pulse is applied to the scanning line WSL101 of the first row,another selection pulse is applied to the scanning line WSL102 of thesecond row, and thereafter, pixels for one row are selected for each onehorizontal period (1 H). Since also the scanning line DSL101 is selectedsimultaneously with the selection of the scanning line WSL101, theswitching TFT 112 is turned on. Consequently, driving current flows tothe light emitting element 117 through the drive TFT 111 and theswitching TFT 112 so that light is emitted from the light emittingelement 117. Intermediately within one field period (1 f), the scanningline DSL101 is placed into a non-selection state, and the switching TFT112 is turned off. Consequently, the emission of light is stopped. Thescanning line DSL101 controls the period of time (duty) of lightemission which occupies the one field period.

FIG. 15A is a graph illustrating a working point of the drive transistor111 and the EL element 117 in the initial state. Referring to FIG. 13 a,the axis of abscissa indicates the drain-source voltage Vds of the drivetransistor 111, and the axis of ordinate indicates the drain currentIds. As seen in FIG. 13 a, the source potential depends upon the workingpoint of the drive transistor 111 and the EL element 117, and thevoltage of the source potential has a value which is different dependingupon the gate voltage. Since the drive transistor 111 is driven in thesaturation region, the drain current Ids of the current value defined bythe expression (1) given hereinabove with respect to the gate-sourcevoltage Vgs corresponding to the source voltage of the working point issupplied.

However, the I-V characteristic of the EL element deteriorates with timeas described hereinabove. As seen in FIG. 15B, the aged deteriorationchanges the working point, and even if an equal gate voltage is applied,the source voltage of the transistor changes. Consequently, thegate-source voltage Vgs of the drive transistor 111 changes, and thevalue of flowing current varies. Simultaneously, also the value ofcurrent flowing though the EL element 117 varies. In this manner, thepixel circuit of a source follower configuration shown in FIG. 13 has asubject to be solved that, if the I-V characteristic of the organic ELelement changes, then the luminance of light emission of the organic ELelement varies with time.

It is to be noted that also it is a possible idea to dispose the driveTFT 111 and the EL element 117 reversely in order to eliminate thesubject described above. In particular, according to the possiblecircuit configuration just mentioned, the source of the drive transistor111 is connected to the ground potential GND and the drain of the drivetransistor 111 is connected to the cathode of the EL element 117 whilethe anode of the EL element 117 is connected to the power supplypotential Vcc. In the circuit configuration described, the potential ofthe source of the drive transistor 111 is fixed and the drive transistor111 operates as a constant current source similarly as in the pixelcircuit of the p-channel TFT configuration described hereinabove withreference to FIG. 11. Consequently, also a luminance variation bydeterioration of the I-V characteristic of the EL element can beprevented. However, according to the circuit configuration, it isnecessary to connect the drive transistor to the cathode side of the ELelement. Such cathode connection requires development of a novel anodeelectrode and cathode electrode, and it is considered that this is verydifficult with the technique at present. From the foregoing situation,the conventional technique fails to place an organic EL displayapparatus which uses an n-channel transistor and does not exhibit aluminance variation into practical use.

In an organic EL display apparatus of the active matrix type, also thethreshold voltage of n-channel TFTs which form the pixel circuit varieswith time in addition to the characteristic variation of the EL element.As is apparent from the expression (1) given hereinabove, if thethreshold voltage Vth of the drive transistor varies, then the draincurrent Ids changes. Consequently, there is a subject to be solved thatthe luminance of emitted light varies by variation of the thresholdvoltage Vth.

Therefor, it is desirable to provide a pixel circuit by which theluminance of light to be emitted can be kept fixed even if the I-Vcharacteristic of a load element of the current driven type (anelectro-optical element such as, for example, an organic EL element)such as a light emitting element varies with time.

It is also desirable to provide a pixel circuit wherein a load elementcan be driven stably even if the threshold voltage of a transistor whichforms the pixel circuit varies with time.

It is further desirable to provide a pixel circuit having a function ofcompensating for a characteristic variation of a load element andanother function of compensating for a variation of the thresholdvoltage of a transistor wherein the number of circuit componentsnecessary to provide the compensation functions is reduced to theutmost.

According to an embodiment of the present invention, there is provided apixel circuit disposed at a point at which a scanning line and a signalline intersect with each other, including an electro-optical element, aholding capacitor, a sampling transistor, a drive transistor, aswitching transistor, a first detection transistor and a seconddetection transistor, wherein said sampling transistor samples an inputsignal from said signal line into said holding capacitor, said drivetransistor applies current to said electro-optical element depending onthe input signal held by said holding capacitor which holds a voltagebetween a source and a gate of said driving transistor, said switchingtransistor supplies current from a power supply potential to said drivetransistor, and said first and second detection transistors operating tosupply a threshold voltage of said drive transistor into said holdingcapacitor prior to said sampling transistor sampling said input signalinto said holding capacitor.

According to another embodiment of the present invention, there isprovided an active matrix apparatus including a plurality of scanninglines, a plurality of signal lines disposed perpendicularly to saidscanning lines, and a plurality of pixels respectively disposed atintersections of said scanning lines and said signal lines. Individualpixels include an electro-optical element, a holding capacitor, asampling transistor, a drive transistor, a switching transistor, a firstdetection transistor and a second detection transistor. The samplingtransistor samples an input signal from said signal line into saidholding capacitor, said drive transistor applies current to saidelectro-optical element depending on the input signal held by saidholding capacitor which holds a voltage between a source and a gate ofsaid driving transistor, said switching transistor supplies current froma power supply potential to said drive transistor, and said first andsecond detection transistors operate to supply a threshold voltage ofsaid drive transistor into said holding capacitor prior to said samplingtransistor sampling said input signal into said holding capacitor.

According to still another embodiment of the present invention, there isprovided a display apparatus including a plurality of scanning lines, aplurality of signal lines disposed perpendicularly to said scanninglines, and a plurality of pixels respectively disposed at intersectionsof said scanning lines and said signal lines. Individual ones of saidplurality of pixels further comprise an electro-optical element, aholding capacitor, a sampling transistor, a drive transistor, aswitching transistor, a first detection transistor, and a seconddetection transistor. The sampling transistor samples an input signalfrom said signal line into said holding capacitor, the drive transistorapplies current to said electro-optical element depending on the inputsignal held by said holding capacitor which holds a voltage between asource and a gate of said driving transistor, the switching transistorsupplies current from a power supply potential to said drive transistor,and the first and second detection transistor operate to supply athreshold voltage of said drive transistor into said holding capacitorprior to said sampling transistor sampling said input signal into saidholding capacitor.

According to still another embodiment of the present invention, there isprovided a pixel circuit disposed at intersection of a scanning line anda signal line. The pixel circuit includes an electro-optical element, aholding capacitor, a sampling transistor, a drive transistor, aswitching transistor, a first detection transistor and a seconddetection transistor. The sampling transistor samples an input signalfrom said signal line into said holding capacitor, the drive transistorapplies current to said electro-optical element depending on the inputsignal held by said holding capacitor, the switching transistor suppliesvoltage of one of two electrodes of said holding capacitor to a gate ofsaid driving transistor at on state, and the first and second detectiontransistors operate to supply a threshold voltage of said drivetransistor into said holding capacitor prior to said sampling transistorsampling said input signal into said holding capacitor.

According to still another embodiment of the present invention, there isprovided an active matrix apparatus that includes a plurality ofscanning lines, a plurality of signal lines disposed perpendicularly tosaid scanning lines, and a plurality of pixels respectively disposed atintersections of said scanning lines and said signal lines. Individualones of said plurality of pixels may include an electro-optical element,a holding capacitor, a sampling transistor, a drive transistor, aswitching transistor, a first detection transistor and a seconddetection transistor. The sampling transistor samples an input signalfrom said signal line into said holding capacitor, the drive transistorapplies current to said electro-optical element depending on the inputsignal held by said holding capacitor, the switching transistor suppliesvoltage of one of two electrodes of said holding capacitors to a gate ofsaid driving transistor at on state, and the first and second detectiontransistors operate to supply a threshold voltage of said drivetransistor into said holding capacitor prior to said sampling transistorsampling said input signal into said holding capacitor.

According to still another embodiment of the present invention, there isprovided a display apparatus that includes a plurality of scanninglines, a plurality of signal lines disposed perpendicularly to saidscanning lines, and a plurality of pixels respectively disposed atintersections of said scanning lines and said signal lines. Individualones of said plurality of pixels may include an electro-optical element,a holding capacitor, a sampling transistor, a drive transistor, aswitching transistor, a first detection transistor, and a seconddetection transistor. The sampling transistor samples an input signalfrom said signal line into said holding capacitor, the drive transistorapplies current to said electro-optical element depending on the inputsignal held by said holding capacitor, the switching transistor suppliesvoltage of one of two electrodes of said holding capacitors to a gate ofsaid driving transistor at on state, and the first and second detectiontransistors operate to supply a threshold voltage of said drivetransistor into said holding capacitor prior to said sampling transistorsampling said input signal into said holding capacitor.

According to certain embodiments of the present invention, the pixelcircuit includes an electro-optical element, a holding capacitor, asampling transistor, a drive transistor, a switching transistor, a firstdetection transistor and a second detection transistor. The pixelcircuit has a bootstrap function of the holding capacitor, andtherefore, even if the I-V characteristic of an electro-optical elementof a current driven type such as a light emitting element varies withtime, the luminance of light emission can be kept fixed. Further, thethreshold voltage of the drive transistor is detected by the first andsecond detection transistors, and the variation of the threshold voltageof the drive transistor is compensated for by the circuit means.Consequently, the electro-magnetic element can be driven stably.Particularly, the pixel circuit has a reasonable configuration whichincludes a minimized number of circuit elements. As the number ofcomponent elements is small, the yield is enhanced and reduction in costcan be anticipated.

The above and other objects, features and advantages of the presentinvention will become apparent from the following description and theappended claims, taken in conjunction with the accompanying drawings inwhich like parts or elements denoted by like reference symbols.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram showing an example of a pixel circuit;

FIGS. 2A to 2F are circuit diagrams illustrating operation of the pixelcircuit shown in FIG. 1;

FIG. 3 is a timing chart illustrating operation of the pixel circuitshown in FIG. 1;

FIG. 4 is a circuit diagram showing another example of a pixel circuit;

FIG. 5 is a timing chart illustrating operation of the pixel circuitshown in FIG. 4;

FIG. 6 is a circuit diagram showing a configuration of a pixel circuitto which the present invention is applied;

FIG. 7 is a timing chart illustrating operation of the pixel circuitshown in FIG. 6;

FIG. 8 is a circuit diagram showing a configuration of another pixelcircuit to which the present invention is applied;

FIG. 9 is a timing chart illustrating operation of the pixel circuitshown in FIG. 8;

FIG. 10 is a block diagram showing a configuration of a conventionalorganic EL display apparatus;

FIG. 11 is a circuit diagram showing an example of a conventional pixelcircuit;

FIG. 12 is a graph illustrating aged deterioration of a characteristicof an EL element;

FIG. 13 is a circuit diagram showing another example of a conventionalpixel circuit;

FIG. 14 is a timing chart illustrating operation of the pixel circuitshown in FIG. 13; and

FIGS. 15A and 15B are graphs illustrating a working point of a drivetransistor and an EL element.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Now, preferred embodiments of the present invention are described indetail with reference to the accompanying drawings. For the convenienceof description, a pixel circuit which has a characteristic variationcompensation function (bootstrap function) of a light emitting elementserving as a load element is described first, and then, another pixelcircuit which additionally has a threshold voltage variationcompensation function of a drive transistor is described. Thereafter,further pixel circuits which have such compensation functions asmentioned above while they are composed of a minimized number of circuitcomponents are described. FIG. 1 shows a configuration of a displayapparatus which includes a pixel circuit having a bootstrap functionwhich is a compensation function for a characteristic variation of alight emitting element which is an electro-optical element. It is to benoted that the circuit configuration shown in FIG. 1 is disclosed inJapanese Patent Application No. 2003-146758 filed on May 23, 2003 inJapan, as well as corresponding International Application No.PCT/JP2004/007304 filed on May 21, 2004 and U.S. application Ser. No.10/557,800, filed on Nov. 18, 2005, all of which are commonly owned bythe assignee of the present patent application.

Referring to FIG. 1, the display apparatus 100 shown includes a pixelarray section 102 in which pixel circuits (PXLC) 101 are arranged in amatrix, a horizontal selector (HSEL) 103, a write scanner (WSCN) 104,and a drive scanner (DSCN) 105. The display apparatus 100 furtherincludes signal lines DTL101 to DTL10 n for being selected by thehorizontal selector 103 such that a signal based on luminanceinformation is supplied thereto, scanning lines WSL101 to WSL10 m forbeing selectively driven by the write scanner 104, and scanning linesDSL101 to DSL10 m for being selectively driving by the drive scanner105. It is to be noted that, for the simplified illustration, aparticular configuration of one pixel circuit is shown in FIG. 1.

The pixel circuit 101 includes n-channel TFTs 111 to 115, a capacitorC111, a light emitting element 117 formed from an organic EL element(OLED: Organic Light Emitting Diode), and nodes ND111 and ND112.Further, in FIG. 1, reference character DTL101 denotes a signal line,WSL101 a scanning line, and DSL101 another scanning line. Of thecomponents, the TFT 111 serves as a driving field effect transistor; thesampling TFT 115 serves as a first switch; the TFT 114 serves as asecond switch; and the capacitor C111 serves as a holding capacitanceelement.

In the pixel circuit 101, the light emitting element (OLED) 117 isinterposed between the source of the TFT 111 and a ground potential GND.More particularly, the anode of the light emitting element 117 isconnected to the source of the TFT 111, and the cathode side of thelight emitting element 117 is connected to the ground potential GND. Thenode ND111 is formed from a connecting point between the anode of thelight emitting element 117 and the source of the TFT 111. The source ofthe TFT 111 is connected to the drain of the TFT 114 and a firstelectrode of the capacitor C111, and the gate of the TFT 111 isconnected to the node ND112. The source of the TFT 114 is connected to afixed potential (in the present embodiment, the ground potential GND),and the gate of the TFT 114 is connected to the scanning line DSL101.The second electrode of the capacitor C111 is connected to the nodeND112. The source and the drain of the sampling TFT 115 are connected tothe signal line DTL101 and the node ND112, respectively. The gate of theTFT 115 is connected to the scanning line WSL101.

In this manner, the pixel circuit 101 according to the presentembodiment is configured such that the capacitor C111 is connectedbetween the gate and the source of the TFT 111 serving as a drivetransistor so that the source potential of the TFT 111 is connected tothe fixed potential through the TFT 114 serving as a switchingtransistor.

Now, operation of the display apparatus 100 having the configurationdescribed above is described with reference to FIGS. 2A to 2F and 3A to3F principally in connection to operation of the pixel circuit. It is tobe noted that FIG. 3A illustrates a scanning signal ws[1] applied to thescanning line WSL101 of the first row of the pixel array; FIG. 3Billustrates another scanning signal ws[2] applied to the scanning lineWSL102 of the second row of the pixel array; FIG. 3C illustrates adriving signal ds[1] applied to the scanning line DSL101 of the firstrow of the pixel array; FIG. 3D illustrates another driving signal ds[2]applied to the scanning line DSL102 of the second row of the pixelarray; FIG. 3E illustrates a gate potential Vg (node ND112) of the TFT111; and FIG. 3F illustrates the source potential Vs (node ND111) of theTFT 111.

First, in an ordinary light emitting state of the EL light emittingelement 117, the scanning signals ws[1], ws[2], . . . to the scanninglines WSL101, WSL102, . . . are selectively set to the low level by thewrite scanner 104 and the driving signals ds[1], ds[2], . . . to thescanning lines DSL101, DSL102, . . . are selectively set to the lowlevel by the drive scanner 105 as seen in FIGS. 3A to 3D. As a result,in the pixel circuit 101, the TFT 115 and the TFT 114 are held in an offstate as seen in FIG. 2A.

Then, within a no-light emission period of the EL light emitting element117, the scanning signals ws[1], ws[2], . . . to the scanning linesWSL101, WSL102, . . . are held at the low level by the write scanner 104and the driving signals ds[1], ds[2], . . . to the scanning linesDSL101, DSL102, . . . are selectively set to the high level by the drivescanner 105 as seen in FIGS. 3A to 3D. As a result, in the pixel circuit101, the TFT 114 is turned on while the TFT 115 is held in an off stateas seen in FIG. 2B. Thereupon, current flows through the TFT 114, andthe source potential Vs of the TFT 111 drops down to the groundpotential GND as seen in FIG. 3F. Therefore, also the voltage applied tothe light emitting element 117 drops to 0 V, and the light emittingelement 117 is placed into a no-light emission state.

Thereafter, while the driving signals ds[1], ds[2], . . . to thescanning lines DSL101, DSL102, . . . are kept at the high level by thedrive scanner 105, the scanning signals ws[1], ws[2], . . . to thescanning lines WSL101, WSL102, . . . are selectively set to the highlevel by the write scanner 104 as seen in FIGS. 3A to 3D. As a result,in the pixel circuit 101, while the TFT 114 is held in an on state, theTFT 115 is placed into an on state as seen in FIG. 2C. Consequently, aninput signal (Vin) propagating to the signal line DTL101 by thehorizontal selector 103 is written into the capacitor C111 as a holdingcapacitor. At this time, since the source potential Vs of the TFT 111 asa drive transistor is equal to the ground potential level (GND level),the potential difference between the gate and the source of the TFT 111is equal to the signal Vin of the input signal.

Thereafter, within the no-light emission period of the light emittingelement 117, while the driving signals ds[1], ds[2], . . . to thescanning lines DSL101, DSL102, . . . are held at the high level by thedrive scanner 105, the scanning signals ws[1], ws[2], . . . to thescanning lines WSL101, WSL102, . . . are selectively set to the lowlevel by the write scanner 104 as seen in FIGS. 3A to 3D. As a result,in the pixel circuit 101, the TFT 115 is placed into an off state asseen in FIG. 2D, and the writing of the input signal into the capacitorC111 as a holding capacitor is completed therewith.

Thereafter, the scanning signals ws[1], ws[2], . . . to the scanninglines WSL101, WSL102, . . . are held at the low level by the writescanner 104 and the driving signals ds[1], ds[2], . . . to the scanninglines DSL101, DSL102, . . . are selectively set to the low level by thedrive scanner 105 as seen in FIGS. 3A to 3D. As a result, in the pixelcircuit 101, the TFT 114 is placed into an off state as seen in FIG. 2E.After the TFT 114 is placed into an off state, the source potential Vsof the TFT 111 as a drive transistor rises, and current flows also tothe light emitting element 117.

Although the source potential Vs of the TFT 111 varies, the gate-sourcevoltage is normally held at the voltage Vin as seen in FIGS. 3E and 3F.At this time, since the TFT 111 as a drive transistor operates in asaturation region, the current value Ids flowing through the TFT 111depends upon the voltage Vin which is the gate-source voltage of the TFT111. The current Ids flows also to the light emitting element 117similarly, and consequently, the light emitting element 117 emits light.An equivalent circuit of the light emitting element 117 is shown in FIG.2F, and consequently, the potential at the node ND111 rises up to thegate potential with which the current Ids flows through the EL lightemitting element 117. As the potential rises in this manner, also thepotential at the node ND112 rises similarly through the capacitor C111(holding capacitor). Consequently, the gate-source voltage of the TFT111 is held at the voltage Vin as described hereinabove.

Usually, the I-V characteristic of an EL light emitting elementdeteriorates as the time of light emission therefrom increases.Therefore, even if the drive transistor supplies current of an equalvalue, the potential applied to the EL light emitting element varies andthe potential at the node ND111 drops. However, in the present circuit,since the potential at the node ND111 drops while the gate-sourcevoltage of the drive transistor is kept fixed, current to flow to thedrive transistor (TFT 111) does not change. Consequently, also thecurrent flowing to the EL light emitting element does not change, andeven if the I-V characteristic of the EL light emitting elementdeteriorates, current corresponding to the input voltage Vin continuesto flow.

As described above, in the present form for reference of the pixelcircuit, the source of the TFT 111 as a drive transistor is connected tothe anode of the light emitting element 117 while the drain of the TFT111 is connected to the power supply potential Vcc, and the capacitorC111 is connected between the gate and the source of the TFT 111 suchthat the source potential of the TFT 111 is connected to the fixedpotential through the TFT 114 as a switch transistor. Consequently, thefollowing advantages can be anticipated. In particular, even if the I-Vcharacteristic of the EL light emitting element varies with time, asource follower output free from deterioration in luminance can beobtained. Further, a source follower circuit of n-channel transistorscan be implemented, and an n-channel transistor can be used as a drivingelement for the EL light emitting element while existing anode andcathode electrodes are used. Further, the transistors of the pixelcircuit can be formed only from n-channel transistors, and consequently,the a-Si process can be used in TFT production. As a result, productionof a TFT at a low cost can be anticipated.

FIG. 4 shows a configuration of a pixel circuit wherein a thresholdvoltage cancellation function is additionally provided for the pixelcircuit having a bootstrap function described hereinabove with referenceto FIG. 1. The pixel circuit shown in FIG. 4 is same as the pixelcircuit disclosed in Japanese Patent Application No. 2003-159646 filedon Jun. 4, 2003 in Japan, as well as corresponding InternationalApplication No. PCT/JP2004/008055 filed on Jun. 3, 2004 and U.S.application Ser. No. 10/558,372, filed on Nov. 29, 2005, all of whichare commonly owned by the assignee of the present patent application.The pixel circuit of FIG. 4 is basically formed from the pixel circuitof FIG. 1 to which a threshold voltage cancellation circuit is added.However, the scanning line WSL101 is connected in place of the scanningline DSL101 to the gate of the TFT 114 included in the bootstrap circuitto simplify the circuit-configuration. It is basically necessary only tocontrol the TFT 114 included in the bootstrap circuit so as to beswitched on and off in synchronism with sampling of a video signal, andtherefore, such simplification as described above is permitted.Naturally, a scanning line DSL101 for exclusive use may be connected tothe gate of the TFT 114 similarly as in the example of FIG. 1.

Referring to FIG. 4, the threshold voltage cancellation circuit isbasically includes a drive transistor 111, a switching transistor 112,an additional switching transistor 113, and a capacitor C111. Inaddition to the components of the threshold voltage cancellationcircuit, the pixel circuit shown in FIG. 4 includes a coupling capacitorC112 and a switching transistor 116. The source/drain of theadditionally provided switching transistor 113 are connected between thegate and the drain of the TFT 111. Further, the drain of the switchingtransistor 116 is connected to the drain of the TFT 115, and an offsetvoltage Vofs is supplied to the source of the switching transistor 116.The coupling capacitor C112 is interposed between a node ND114 on theTFT 115 side and the node ND112 on the drive transistor 111 side. Ascanning line AZL101 for the cancellation of a threshold voltage (Vth)is connected to the gates of the switching transistors 113 and 116.

FIG. 5 illustrate operation of the pixel circuit shown in FIG. 4. Thepixel circuit performs threshold voltage Vth correction, signal writingand bootstrap operation in order within a period of one field (1 f). Thethreshold voltage Vth correction and the signal writing are performedwithin a no-light emission period of 1 f, and the boot strap operationis performed at the top of a light emission period. Further, within thethreshold voltage Vth correction period, the scanning line AZL101 buildsup to the high level while the scanning line DSL101 remains at the highlevel. Consequently, the switching transistors 112 and 113 are turned onsimultaneously, and therefore, current flows and the potential at thenode ND112 connecting to the gate of the TFT 111 rises. Thereafter, thescanning line DSL101 falls to the low level, and consequently, the lightemitting element 117 is placed into a no-light emitting state.Consequently, charge accumulated at the node ND112 is discharged throughthe switching transistor 113, and the potential at the node ND112 dropsgradually. Then, when the potential difference between the node ND112and the node ND111 becomes equal to the threshold voltage Vth, thecurrent through the TFT 111 stops. As can be seen apparently from FIG.5, the potential difference between the node ND112 and the node ND111corresponds to the gate-source voltage Vgs, and from the expression (1),when Vgs=Vth is reached, the current value Ids becomes equal to 0. As aresult, the threshold voltage Vth between the nodes ND112 and ND111 isheld by the capacitor C111.

Then, the scanning line WSL101 exhibits the high level within a periodof 1 H, and within the period, the sampling transistor 115 conducts andwriting of a signal is performed. In particular, a video signal Vsigsupplied to the signal line DTL101 is sampled by the sampling transistor115 and written into the capacitor C111 through the coupling capacitorC112. As a result, the held potential Vin of the capacitor C111 becomesequal to the sum of the threshold voltage Vth written formerly and thevideo signal Vsig. However, the input gain of the video signal Vsig isnot 100% but exhibits some loss.

Thereafter, the scanning line DSL101 builds up to the high level andemission of light is started, and the bootstrap operation is performed.Consequently, the signal potential Vin applied to the gate of the drivetransistor 111 rises by ΔV in accordance with the I-D characteristic ofthe EL light emitting element 117. In this manner, the pixel circuit ofFIG. 4 adds the threshold voltage Vth and the voltage ΔV to the netsignal component applied to the gate of the drive transistor 111. Evenif the threshold voltage Vth and the voltage ΔV vary, since theinfluence of the variation can be cancelled, the light emitting element117 can be driven stably.

FIG. 6 shows a pixel circuit to which the present invention is appliedand which is composed of a number of elements reduced from that of thepixel circuit described hereinabove with reference to FIG. 4. Referringto FIG. 6, the present pixel circuit 101 is disposed at each of pointsat which scanning lines and signal lines intersect with each other andcan be applied to a display apparatus of the active matrix type. Whilethe number of signal lines is only one which is the signal line DTL101,the number of scanning lines is four including scanning lines WSL101,DSL101, AZL101 a and AZL101 b disposed in parallel to each other. Thepixel circuit 101 is composed of five N-channel thin film transistorsincluding an electro-optical element 117, a capacitor C111, a samplingtransistor 115, a drive transistor 111, a switching transistor 112, afirst detection transistor 114 and a second detection transistor 113. Inthis manner, the pixel circuit 101 is composed of one holding capacitorand five transistors, and when compared with the pixel circuit shown inFIG. 4, the number of capacitance elements is smaller by one and alsothe number of transistors is smaller by one. Since the number ofcomponent elements is smaller, the yield can be enhanced and the costcan be reduced as much.

The holding capacitor C111 is connected at one terminal thereof to thesource of the drive transistor 111 and at the other terminal thereof tothe gate of the drive transistor 111 similarly. In FIG. 6, the gate ofthe drive transistor 111 is represented by the node ND112, and thesource of the drive transistor 111 is represented by the node ND111similarly. Accordingly, the holding capacitor C111 is connected betweenthe node ND111 and the node ND112. The electro-optical element 117 isformed from, for example, an organic EL element of a diode structure andhas an anode and a cathode. The organic EL element 117 is connected atthe anode thereof to the source (node ND111) of the drive transistor 111and at the cathode thereof to a predetermined cathode potential Vcath.It is to be noted that the organic EL element 117 includes a capacitancecomponent between the anode and the cathode thereof, and the capacitancecomponent is represented by Cp.

The first detection transistor 114 is connected at the source thereof toa first ground potential Vss1 and at the drain thereof to the source(node ND111) of the drive transistor 111. The first detection transistor114 is further connected at the gate thereof to a scanning line AZL101a. The second detection transistor 113 is connected at the sourcethereof to a second ground potential Vss2 and at the drain thereof tothe gate (node ND112) of the drive transistor 111. Further, the seconddetection transistor 113 is connected at the gate thereof to a scanningline AZL101 b.

The sampling transistor 115 is connected at the source thereof to thesignal line DTL101, at the drain thereof to the gate (node ND112) of thedrive transistor 111 and at the gate thereof to the scanning lineWSL101. The switching transistor 112 is connected at the drain thereofto the power supply potential Vcc, at the source thereof to the drain ofthe drive transistor 111, and at the gate thereof to the scanning lineDSL101. The scanning lines AZL101 a, AZL101 b and DSL101 are disposed inparallel to the scanning line WSL101 and are scanned line sequentiallyat suitable timings by the peripheral scanners.

The sampling transistor 115 operates when it is selected by the scanningline WSL101 to sample an input signal Vsig from the signal line DTL101and place the sampled input signal Vsig into the holding capacitor C111through the node ND112. The drive transistor 111 drives theelectro-optical element 117 with current in response to the signalpotential Vin held in the holding capacitor C111. The switchingtransistor 112 is rendered conducting when it is selected by thescanning line DSL101 to supply current from the power supply potentialVcc to the drive transistor 111. The first detection transistor 114 andthe second detection transistor 113 operate when they are selected bythe scanning lines AZL101 a and AZL101 b, respectively, to detect thethreshold voltage Vth of the drive transistor 111 prior to the currentdriving of the electro-optical element 117 and place the detectedpotential into the holding capacitor C111 in order to cancel aninfluence of the threshold voltage Vth.

As a condition for securing normal operation of the pixel circuit 101,the first ground potential Vss1 is set lower than a level calculated bysubtracting the threshold voltage Vth of the drive transistor from thesecond ground potential Vss2. In other words, the first ground potentialVss1 is set so as to satisfy Vss1<Vss2−Vth. Further, a level calculatedby adding a threshold voltage VthEL of the organic EL element 117 to thecathode potential Vcath is set higher than another level calculated bysubtracting the threshold voltage Vth of the drive transistor 111 fromthe first ground potential Vss1. Where this is represented by anexpression, Vcath+VthEL>Vss1−Vth. Preferably, the level of the secondground potential Vss2 is set to a value in the proximity of the lowestlevel of the input signal Vsig supplied from the signal line DTL101.

Operation of the pixel circuit shown in FIG. 6 is described in detailwith reference to a timing chart of FIG. 7. The timing chart of FIG. 7is represented such that one field (1F) starts at timing T1 and ends atanother timing T6. At timing T0 before the field is entered, thescanning lines WSL101, AZL101 a and AZL101 b have the low level whilethe scanning line DSL101 has the high level. Accordingly, the switchingtransistor 112 is in an on state while the sampling transistor 115 andthe detection transistors 113 and 114 in pair are in an off state. Atthis time, the drive transistor 111 supplies driving current in responseto the signal potential appearing at the node ND112 to energize theelectro-optical element 117 to emit light. At this time, the sourcepotential of the drive transistor 111 (potential at the node ND111) isheld at a predetermined working point. The timing chart of FIG. 7illustrates the potential at the node ND112 and the potential at thenode ND111, which represent variation of the gate potential and thesource potential of the drive transistor 111, respectively.

At timing T1, both of the scanning lines AZL101 a and AZL101 b build upfrom the low level to the high level. As a result, both of the firstdetection transistor 114 and the second detection transistor 113 changeover from an off state to an on state. As a result, the potential at thenode ND112 drops to the second ground potential Vss2 quickly, and alsothe potential at the node ND111 drops to the first ground potential Vss1quickly. At this time, since the first ground potential Vss1 and thesecond ground potential Vss2 are set so as to satisfy Vss1<Vss2−Vth asdescribed hereinabove, the drive transistor 111 keeps the on state anddrain current Ids flows. At this time, since the relationship ofVcath+Vth(EL)>Vss1−Vth is satisfied, the organic EL element 117 is in areversely biased state and no current flows therethrough. Accordingly,the organic EL element 117 is placed into a no-light emission state. Thedrain current Ids of the drive transistor 111 flows to the first groundpotential Vss1 side through the first detection transistor 114 which isin an on state.

Then at timing T2, the scanning line AZL101 a changes over from the highlevel to the low level, and consequently, the first detection transistor114 changes over from an on state to an off state. As a result, thecurrent path of the drain current Ids flowing through the drivetransistor 111 is interrupted, and the potential at the node ND111 risesgradually. When the difference between the potential at node ND111 andthe potential at node ND112 becomes equal to the threshold voltage Vth,the drive transistor 111 changes over from an on state to an off stateand the drain current Ids stops. The potential difference Vth appearingbetween the node ND111 and the node ND112 is held by the holdingcapacitor C111. In this manner, the first and second detectiontransistors 114 and 113 operate when they are selected at suitabletimings by the scanning lines AZL101 a and AZL101 b, respectively, anddetect the threshold voltage Vth of the drive transistor 111 and placethe threshold voltage Vth into the holding capacitor C111.

Thereafter, at timing T3, the scanning line AZL101 b changes over fromthe high level to the low level, and also the scanning line DSL101changes over from the high level to the low level at a substantiallysame timing. As a result, the second detection transistor 113 and theswitching transistor 112 change over from an on state to an off state.On the timing chart of FIG. 7, the period of time from timing T2 totiming T3 is denoted by Vth correction period, and the detectedthreshold voltage Vth of the drive transistor 111 is held as acorrection potential in the holding capacitor C111.

Thereafter, at timing T4, the scanning line WSL101 builds up from thelow level to the high level. Consequently, the sampling transistor 115is rendered conducting, and the input potential Vin is written into theholding capacitor C111. The input potential Vin is held in such a formthat it is added to the threshold voltage Vth of the driving transistor.As a result, the variation of the threshold voltage Vth of the drivetransistor 111 is always cancelled, and therefore, this signifies thatVth correction is performed. It is to be noted that the input potentialVin written into the holding capacitor C111 is represented by thefollowing expression:Vin=Cp/(Cs+Cp)×(Vsig−Vss2)where Cs is the capacitance value of the holding capacitor C111, and Cpthe capacitance component of the organic EL element 117 as describedhereinabove. Usually, the capacitance component Cp of the organic ELelement 117 is much higher than the capacitance value Cs of the holdingcapacitor C111. Accordingly, the input potential Vin is substantiallyequal to Vsig−Vss2. In this instance, if the second ground potentialVss2 is set to a value in the proximity of the black level of the inputsignal Vsig, then the input signal Vin becomes substantially equal tothe input signal Vsig.

Thereafter, the scanning line WSL101 changes over from the high levelback to the low level thereby to end the sampling of the input signalVsig. Then at timing T5, the scanning line DSL101 builds up from the lowlevel to the high level and the switching transistor 112 is placed intoan on state. Consequently, driving current is supplied from the powersupply potential Vcc to the drive transistor 111 to start a lightemitting operation of the organic EL element 117. Since current flowsthrough the organic EL element 117, a voltage drop appears and thepotential at the node ND111 rises. In response to the potential rise,also the potential at the node ND112 rises, and consequently, the gatepotential Vgs of the drive transistor 111 is always kept at Vin+Vthirrespective of the potential rise at the node ND111. As a result, theorganic EL element 117 continues to emit light with a luminancecorresponding to the input voltage Vin. When the scanning lines AZL101 aand AZL101 b build up at timing T6 at the end of the one field, thethreshold voltage Vth correction period of the next field is entered andalso the emission of light from the electro-optical element 117 stops.

FIG. 8 shows a pixel circuit according to another embodiment of thepresent invention. Referring to FIG. 8, the present pixel circuit 101 isdisposed at each of points at which scanning lines and signal linesintersect with each other and can be applied to a display apparatus ofthe active matrix type. While the number of signal lines is only onewhich is the signal line DTL101, the number of scanning lines is fourincluding scanning lines WSL101, DSL101, AZL101 a and AZL101 b disposedin parallel to each other. The pixel circuit 101 is basically composedof five N-channel thin film transistors including an electro-opticalelement 117, a holding capacitor C111, a sampling transistor 115, adrive transistor 111, a switching transistor 112, a first detectiontransistor 114 and a second detection transistor 113. When compared withthe pixel circuit shown in FIG. 1, the number of capacitance elements issmaller by one and also the number of transistors is smaller by one.Since the pixel circuit implemented is composed of one capacitanceelement and five transistors, the yield can be enhanced and the cost canbe reduced when compared with the conventional pixel circuit.

The drive transistor 111 is connected at the gate thereof to the inputnode ND112, at the source thereof connected to the output node ND111,and at the drain thereof to the predetermined power supply potentialVcc. The electro-optical element 117 is formed from an organic ELelement of a diode type and has an anode and a cathode. Theelectro-optical element 117 is connected at the anode thereof to theoutput node ND111 and at the cathode thereof to a predetermined cathodepotential Vcath. The organic EL element 117 includes a capacitancecomponent in parallel to a resistance component, and the capacitancecomponent is represented by Cp. The holding capacitor C111 is connectedbetween the output node ND111 and the input node ND112. The potentialdifference between the output node ND111 and the input node ND112 isjust equal to the gate potential Vgs of the drive transistor 111. Thesampling transistor 115 is connected at the source thereof to the signalline DTL101, at the drain thereof to the input node ND112, and at thegate thereof to the scanning line WSL101.

The first detection transistor 114 is connected at the source thereof tothe first ground potential Vss1, at the drain thereof to the output nodeND111, and at the gate thereof to the scanning line AZL101 a. The secondswitching transistor 113 is connected at the source thereof to thesecond ground potential Vss2, at the drain thereof to the input nodeND112, and at the gate thereof to the scanning line AZL101 b. Theswitching transistor 112 is connected at the source/drain thereofbetween the input node ND112 and the gate of the drive transistor 111.The switching transistor 112 is connected at the gate thereof to thescanning line DSL101. While, in the example for reference shown in FIG.4, the switching transistor is connected between the power supplypotential Vcc and the drive transistor, in the present embodiment, theswitching transistor 112 is connected between the input node and thegate of the drive transistor. According to the present embodiment, sincethe drive transistor 111 can be connected directly to the power supplypotential Vcc, surplus power consumption can be avoided. Further, sincethe switching transistor 112 is connected to the gate of the drivetransistor 111, it need not have a high current supplying capacity andhence can be miniaturized.

The sampling transistor 115 operates when it is selected by the scanningline WSL101 to sample the input signal Vsig from the signal line DTL101and place the sampled input signal Vsig into the holding capacitor C111.The switching transistor 112 is rendered conducting when it is selectedby the scanning line DSL101 to connect the holding capacitor C111 to thegate of the drive transistor 111. The drive transistor 111 drives theelectro-optical element 117 with current in response to the signalpotential Vin held in the holding capacitor C111. The first detectiontransistor 114 and the second switching transistor 113 operate when theyare selected by the different scanning lines AZL101 a and AZL101 b,respectively, to detect the threshold voltage Vth of the drivetransistor 111 prior to the current driving of the electro-opticalelement 117 and place the detected potential into the holding capacitorC111 in order to cancel an influence of the threshold voltage Vth inadvance. Consequently, even if the threshold voltage Vth varies, sincethe variation is always canceled, the drive transistor 111 can supplyfixed drain current Ids to the organic EL element 117 without beinginfluenced by the variation of the threshold voltage Vth.

In order to cause the pixel circuit 101 to operate normally, thepotential relationship must be set correctly. To this end, the firstground potential Vss1 is set lower than a level calculated bysubtracting the threshold voltage Vth of the drive transistor from thesecond ground potential Vss2. This can be represented by an expressionas Vss1<Vss2 Vth. Further, a level calculated by adding the thresholdvoltage VthEL of the organic EL element 117 to the cathode potentialVcath is set higher than another level calculated by subtracting thethreshold voltage Vth of the drive transistor from the first groundpotential Vss1. Where this is represented by an expression,Vcath+VthEL>Vss1−Vth. The expression represents that the organic ELelement 117 is placed into a reversely biased state. Preferably, thelevel of the second ground potential Vss2 is set to a value in theproximity of the lowest level of the input signal Vsig supplied from thesignal line DTL101. Where the capacitance value of the holding capacitorC111 is represented by Cs, the signal potential Vin held by the holdingcapacitor C111 is represented by the following expression:Vin=(Vsig−Vss2)×(Cp/(Cs+Cp))

The capacitance component Cp of the organic EL element 117 is muchhigher than the value Cs of the holding capacitor, and the signalpotential Vin is substantially equal to Vsig−Vss2. Here, since thesecond ground potential Vss2 is set to a level in the proximity of thelowest level of the input signal Vsig, the signal potential Vin held bythe holding capacitor C111 is substantially equal to the net value ofthe input signal Vsig.

Operation of the pixel circuit shown in FIG. 8 is described in detailwith reference to FIG. 9. The timing chart of FIG. 9 indicates levelvariation of the four scanning lines WSL101, DSL101, AZL101 a and AZL101b within a period of one field (1F). The timing chart further indicatespotential variation at the input node ND112 and the output node ND111 ofthe drive transistor 111 within a period of one field. One field (1F)starts at timing T1 and ends at another timing T6.

At timing T0 before the field is entered, the scanning line DSL101 hasthe high level while the remaining scanning lines WSL101, AZL101 a andAZL101 b have the low level. Accordingly, the switching transistor 112is in an on state while the remaining sampling transistor 115, firstdetection transistor 114 and second detection transistor 113 are in anoff state. In this state, the signal potential Vin held by the holdingcapacitor C111 is applied to the gate of the drive transistor 111through the switching transistor 112 which is in a conducting state.Accordingly, the drive transistor 111 supplies drain current Ids inaccordance with the signal potential Vin to the organic EL element 117.As a result, the organic EL element 117 emits light with a luminancecorresponding to the video signal Vsig.

Then at timing T1, both of the scanning lines AZL101 a and AZL101 bchange over from the low level to the high level at the same time. As aresult, both of the first detection transistor 114 and the seconddetection transistor 113 are turned on simultaneously. As the seconddetection transistor 113 is turned on, the potential at the input nodeND112 drops to the second ground potential Vss2 quickly. Further, as thefirst detection transistor 114 is turned on, the potential at the outputnode ND111 drops down to the first ground potential Vss1 quickly. As aresult, while the gate potential Vgs of the drive transistor 111 isgiven by Vss2−Vss1, since this value is higher than the thresholdvoltage Vth of the drive transistor 111, the drive transistor 111 keepsthe on state and the drain current Ids flows. On the other hand, sincethe potential at the output node ND111 drops to the first groundpotential Vss1, the organic EL element 117 is placed into a reverselybiased state and no current flows therethrough. Accordingly, the organicEL element 117 is placed into a no-light emission state. The draincurrent Ids of the drive transistor 111 flows to the first groundpotential Vss1 through the first detection transistor 114 which is in anon state.

Then at timing T2, the scanning line AZL101 a changes over from the highlevel to the low level, and consequently, the first detection transistor114 is placed into an off state. As a result, the current path to thedrive transistor 111 is interrupted, and the potential at the outputnode ND111 rises gradually. When the potential difference between theoutput node ND111 and the input node ND112 becomes equal to thethreshold voltage Vth of the drive transistor 111, the current becomesequal to zero and the threshold voltage Vth is held by the holdingcapacitor C111 connected between the nodes ND112 and ND111. Thethreshold voltage Vth of the drive transistor 111 is detected by thepair of detection transistors 113 and 114 and held by the holdingcapacitor C111 in this manner. The period of time from timing T2 totiming T3 within which the operation described above is performed isrepresented by a Vth correction period. It is to be noted that thetiming T3 represents a timing at which the scanning line DSL101 and thescanning line AZL101 b change over from the high level to the low levelafter the current reduces to zero. As a result, the switching transistor112 is placed once into an off state and also the second detectiontransistor 113 is placed into an off state. Consequently, the input nodeND112 is disconnected from the gate of the drive transistor 111 and alsofrom the second ground potential Vss2 and therefore can thereafterperform sampling operation.

At timing T4, the scanning line WSL101 builds up to the high level andthe sampling transistor 115 is turned on. Consequently, the input signalVsig supplied from the signal line DTL101 is sampled, and the inputpotential Vin which is substantially equal to the net value of the inputsignal Vsig is written into the holding capacitor C111. The inputpotential Vin is held in such a form that it is added to the thresholdvoltage Vth held formerly.

At timing T5 after the sampling of the video signal Vsig comes to an endin this manner, the scanning line DSL101 builds up to the high levelagain and the switching transistor 112 is placed into an on state sothat emission of light from the organic EL element 117 is started. Inparticular, the input potential Vin held in the holding capacitor C111is applied to the gate of the drive transistor 111 through the switchingtransistor 112. The drive transistor 111 supplies the drain current Idsin accordance with the input potential Vin to the organic EL element 117to start emission of light from the organic EL element 117. After thecurrent begins to flow through the organic EL element 117, a voltagedrop occurs, and the level at the output node ND111 begins to rise.Simultaneously, since also the level at the input node ND112 begins torise, the potential Vin+Vth held in the holding capacitor C111 remainsfixed. By such a bootstrap operation as described above, even if thelevel at the output node ND111 varies by variation of the working pointof the organic EL element 117, the drive transistor 111 can supplynormally fixed drain current Ids. At timing T6, the scanning linesAZL101 a and AZL101 b build up finally, and threshold voltage Vthdetection operation for a next field is started.

While preferred embodiments of the present invention have been describedusing specific terms, such description is for illustrative purpose only,and it is to be understood that changes and variations may be madewithout departing from the spirit or scope of the following claims.

What is claimed is:
 1. A pixel circuit disposed at intersection of ascanning line and a signal line comprising: an electro-optical element;a holding capacitor; a sampling transistor; a drive transistor; aswitching transistor; a first detection transistor; and a seconddetection transistor, wherein said sampling transistor samples an inputsignal from said signal line into said holding capacitor; said drivetransistor applies current to said electro-optical element depending onthe input signal held by said holding capacitor which holds a voltagebetween a source and a gate of said driving transistor; said switchingtransistor supplies current from a power supply potential to said drivetransistor; and said first and second detection transistors operate tosupply a threshold voltage of said drive transistor into said holdingcapacitor prior to said sampling transistor sampling said input signalinto said holding capacitor, wherein said first and second detectiontransistors are configured to be simultaneously on during at least aportion of a time period prior to an emission period of saidelectro-optical element.
 2. The pixel circuit according to claim 1,wherein said first detection transistor operates to provide a firstreference potential at a first node of said holding capacitor.
 3. Thepixel circuit according to claim 1, wherein said first detectiontransistor operates to provide a first reference potential at a firstnode of said holding capacitor and said second detection transistoroperates to provide a second reference potential at a second node ofsaid holding capacitor, and wherein the difference between said firstreference potential and said second reference potential is greater thanthe threshold voltage of said drive transistor.
 4. The pixel circuitaccording to claim 1, wherein current from the power supply potentialcauses the voltage at a first node of said holding capacitor to increaseuntil the difference between the voltage at said first node of saidholding capacitor and a second node of said holding capacitor equal tothe threshold voltage of said drive transistor.
 5. The pixel circuitaccording to claim 1, wherein current from the power supply potentialcauses the voltage at a first node of said holding capacitor to increaseuntil the difference between the voltage at said first node of saidholding capacitor and a second node of said holding capacitor becomessubstantially equal to the threshold voltage of said drive transistor.6. The pixel circuit according to claim 2, wherein said second detectiontransistor operates to provide a second reference potential at a secondnode of said holding capacitor.
 7. The pixel circuit according to claim6, wherein current from the power supply potential causes the voltage ata first node of said holding capacitor to increase until the differencebetween the voltage at said first node of said holding capacitor and asecond node of said holding capacitor equals the threshold voltage ofsaid drive transistor.
 8. The pixel circuit according to claim 3,wherein said electro-optical element is connected between a source ofsaid drive transistor and a cathode potential, and wherein said firstreference potential, said second reference potential and said cathodepotential have respective levels such that said increase in the voltageat said first node of said holding capacitor occurs without causing saidelectro-optical element to be in an on state.
 9. The pixel circuitaccording to claim 4, wherein sampling said input signal into saidholding capacitor comprises providing an input signal potential at saidsecond node of said holding capacitor such that the voltage differencebetween said first node of said holding capacitor and said second nodeof said holding capacitor becomes a sum of the input signal potentialand said threshold voltage of said driving transistor.
 10. The pixelcircuit according to claim 4, wherein sampling said input signal intosaid holding capacitor comprises providing an input signal potential atsaid second node of said holding capacitor such that the voltagedifference between said first node of said holding capacitor and saidsecond node of said holding capacitor becomes substantially equal to asum of the input signal potential and said threshold voltage of saiddriving transistor.
 11. An active matrix apparatus, comprising: aplurality of scanning lines; a plurality of signal lines disposedperpendicularly to said scanning lines; and a plurality of pixelsrespectively disposed at intersections of said scanning lines and saidsignal lines, individual ones of said plurality of pixels furthercomprising; an electro-optical element; a holding capacitor; a samplingtransistor; a drive transistor; a switching transistor; a firstdetection transistor; and a second detection transistor, wherein saidsampling transistor samples an input signal from said signal line intosaid holding capacitor; said drive transistor applies current to saidelectro-optical element depending on the input signal held by saidholding capacitor which holds a voltage between a source and a gate ofsaid driving transistor; said switching transistor supplies current froma power supply potential to said drive transistor; and said first andsecond detection transistors operate to supply a threshold voltage ofsaid drive transistor into said holding capacitor prior to said samplingtransistor sampling said input signal into said holding capacitor,wherein said first and second detection transistors are configured to besimultaneously on during at least a portion of a time period prior to anemission period of said electro-optical element.
 12. The active matrixapparatus according to claim 11, wherein said first detection transistoroperates to provide a first reference potential at a first node of saidholding capacitor.
 13. The active matrix apparatus according to claim11, wherein said first detection transistor operates to provide a firstreference potential at a first node of said holding capacitor and saidsecond detection transistor operates to provide a second referencepotential at a second node of said holding capacitor, and wherein thedifference between said first reference potential and said secondreference potential is greater than the threshold voltage of said drivetransistor.
 14. The active matrix apparatus according to claim 11,wherein current from the power supply potential causes the voltage at afirst node of said holding capacitor to increase until the differencebetween the voltage at said first node of said holding capacitor and asecond node of said holding capacitor equals the threshold voltage ofsaid drive transistor.
 15. The active matrix apparatus according toclaim 11, wherein current from the power supply potential causes thevoltage at a first node of said holding capacitor to increase until thedifference between the voltage at said first node of said holdingcapacitor and a second node of said holding capacitor becomessubstantially equal to the threshold voltage of said drive transistor.16. The active matrix apparatus according to claim 12, wherein saidsecond detection transistor operates to provide a second referencepotential at a second node of said holding capacitor.
 17. The activematrix apparatus according to claim 16, wherein current from the powersupply potential causes the voltage at said first node of said holdingcapacitor to increase until the difference between the voltage at saidfirst node of said holding capacitor and said second node of saidholding capacitor equals the threshold voltage of said drive transistor.18. The active matrix apparatus according to claim 13, wherein saidelectro-optical element is connected between a source of said drivetransistor and a cathode potential, and wherein said first referencepotential, said second reference potential and said cathode potentialhave respective levels such that said increase in the voltage at saidfirst node of said holding capacitor occurs without causing saidelectro-optical element to be in an on state.
 19. The active matrixapparatus according to claim 14, wherein sampling said input signal intosaid holding capacitor comprises providing an input signal potential atsaid second node of said holding capacitor such that the voltagedifference between said first node of said holding capacitor and saidsecond node of said holding capacitor becomes a sum of the input signalpotential and said threshold voltage of said driving transistor.
 20. Theactive matrix apparatus according to claim 14, wherein sampling saidinput signal into said holding capacitor comprises providing an inputsignal potential at said second node of said holding capacitor such thatthe voltage difference between said first node of said holding capacitorand said second node of said holding capacitor becomes substantiallyequal to a sum of the input signal potential and said threshold voltageof said driving transistor.
 21. A display apparatus, comprising: aplurality of scanning lines; a plurality of signal lines disposedperpendicularly to said scanning lines; and a plurality of pixelsrespectively disposed at intersections of said scanning lines and saidsignal lines, individual ones of said plurality of pixels furthercomprising: an electro-optical element; a holding capacitor; a samplingtransistor; a drive transistor; a switching transistor; a firstdetection transistor; and a second detection transistor, wherein saidsampling transistor samples an input signal from said signal line intosaid holding capacitor; said drive transistor applies current to saidelectro-optical element depending on the input signal held by saidholding capacitor which holds a voltage between a source and a gate ofsaid driving transistor; said switching transistor supplies current froma power supply potential to said drive transistor; and said first andsecond detection transistor operate to supply a threshold voltage ofsaid drive transistor into said holding capacitor prior to said samplingtransistor sampling said input signal into said holding capacitor.wherein said first and second detection transistors are configured to besimultaneously on during at least a portion of a time period prior to anemission period of said electro-optical element.
 22. The displayapparatus according to claim 21, wherein said first detection transistoroperates to provide a first reference potential at a first node of saidholding capacitor.
 23. The display apparatus according to claim 21,wherein said first detection transistor operates to provide a firstreference potential at a first node of said holding capacitor and saidsecond detection transistor operates to provide a second referencepotential at a second node of said holding capacitor, and wherein thedifference between said first reference potential and said secondreference potential is greater than the threshold voltage of said drivetransistor.
 24. The display apparatus according to claim 21, whereincurrent from the power supply potential causes the voltage at a firstnode of said holding capacitor to increase until the difference betweenthe voltage at said first node of said holding capacitor and a secondnode of said holding capacitor equals the threshold voltage of saiddrive transistor.
 25. The display apparatus according to claim 21,wherein current from the power supply potential causes the voltage at afirst node of said holding capacitor to increase until the differencebetween the voltage at said first node of said holding capacitor and asecond node of said holding capacitor becomes substantially equal to thethreshold voltage of said drive transistor.
 26. The display apparatusaccording to claim 22, wherein said second detection transistor operatesto provide a second reference potential at a second node of said holdingcapacitor.
 27. The display apparatus according to claim 26, whereincurrent from the power supply potential causes the voltage at said firstnode of said holding capacitor to increase until the difference betweenthe voltage at said first node of said holding capacitor and said secondnode of said holding capacitor equals the threshold voltage of saiddrive transistor.
 28. The display apparatus according to claim 23,wherein said electro-optical element is connected between a source ofsaid drive transistor and a cathode potential, and wherein said firstreference potential, said second reference potential and said cathodepotential have respective levels such that said increase in the voltageat said first node of said holding capacitor occurs without causing saidelectro-optical element to be in an on state.
 29. The display apparatusaccording to claim 24, wherein sampling said input signal into saidholding capacitor comprises providing an input signal potential at saidsecond node of said holding capacitor such that the voltage differencebetween said first node of said holding capacitor and said second nodeof said holding capacitor becomes a sum of the input signal potentialand said threshold voltage of said driving transistor.
 30. The displayapparatus according to claim 24, wherein sampling said input signal intosaid holding capacitor comprises providing an input signal potential atsaid second node of said holding capacitor such that the voltagedifference between said first node of said holding capacitor and saidsecond node of said holding capacitor becomes substantially equal to asum of the input signal potential and said threshold voltage of saiddriving transistor.
 31. A pixel circuit disposed at intersection of ascanning line and a signal line, the pixel circuit comprising: anelectro-optical element; a holding capacitor; a sampling transistor; adrive transistor; a switching transistor; a first detection transistorand a second detection transistor, wherein said sampling transistorsamples an input signal from said signal line into said holdingcapacitor; said drive transistor applies current to said electro-opticalelement depending on the input signal held by said holding capacitor;said switching transistor supplies voltage of one of two electrodes ofsaid holding capacitor to a gate of said driving transistor at on state;and said first and second detection transistors operate to supply athreshold voltage of said drive transistor into said holding capacitorprior to said sampling transistor sampling said input signal into saidholding capacitor. wherein said first and second detection transistorsare configured to be simultaneously on during at least a portion of atime period prior to an emission period of said electro-optical element.32. The pixel circuit according to claim 31, wherein said firstdetection transistor operates to provide a first reference potential ata first electrode of said holding capacitor.
 33. The pixel circuitaccording to claim 31, wherein said first detection transistor operatesto provide a first reference potential at a first electrode of saidholding capacitor and said second detection transistor operates toprovide a second reference potential at a second electrode of saidholding capacitor, and wherein the difference between said firstreference potential and said second reference potential is greater thanthe threshold voltage of said drive transistor.
 34. The pixel circuitaccording to claim 31, wherein current from the power supply potentialcauses the voltage at a first electrode of said holding capacitor toincrease until the difference between the voltage at said firstelectrode of said holding capacitor and a second electrode of saidholding capacitor equals the threshold voltage of said drive transistor.35. The pixel circuit according to claim 31, wherein current from thepower supply potential causes the voltage at a first electrode of saidholding capacitor to increase until the difference between the voltageat said first electrode of said holding capacitor and a second electrodeof said holding capacitor becomes substantially equal to the thresholdvoltage of said drive transistor.
 36. The pixel circuit according toclaim 32, wherein said second detection transistor operates to provide asecond reference potential at a second electrode of said holdingcapacitor.
 37. The pixel circuit according to claim 36, wherein currentfrom the power supply potential causes the voltage at said firstelectrode of said holding capacitor to increase until the differencebetween the voltage at said first electrode of said holding capacitorand said second electrode of said holding capacitor equals the thresholdvoltage of said drive transistor.
 38. The pixel circuit according toclaim 33, wherein said electro-optical element is connected between asource of said drive transistor and a cathode potential, and whereinsaid first reference potential, said second reference potential and saidcathode potential have respective levels such that said increase in thevoltage at said first electrode of said holding capacitor occurs withoutcausing said electro-optical element to be in an on state.
 39. The pixelcircuit according to claim 34, wherein sampling said input signal intosaid holding capacitor comprises providing an input signal potential atsaid second electrode of said holding capacitor such that the voltagedifference between said first electrode of said holding capacitor andsaid second electrode of said holding capacitor becomes a sum of theinput signal potential and said threshold voltage of said drivingtransistor.
 40. The pixel circuit according to claim 34, whereinsampling said input signal into said holding capacitor comprisesproviding an input signal potential at said second electrode of saidholding capacitor such that the voltage difference between said firstelectrode of said holding capacitor and said second electrode of saidholding capacitor becomes substantially equal to a sum of the inputsignal potential and said threshold voltage of said driving transistor.41. An active matrix apparatus, comprising: a plurality of scanninglines; a plurality of signal lines disposed perpendicularly to saidscanning lines; and a plurality of pixels respectively disposed atintersections of said scanning lines and said signal lines, individualones of said plurality of pixels further comprising: an electro-opticalelement; a holding capacitor; a sampling transistor; a drive transistor;a switching transistor; a first detection transistor and a seconddetection transistor; wherein said sampling transistor samples an inputsignal from said signal line into said holding capacitor; said drivetransistor applies current to said electro-optical element depending onthe input signal held by said holding capacitor; said switchingtransistor supplies voltage of one of two electrodes of said holdingcapacitors to a gate of said driving transistor at on state; and saidfirst and second detection transistors operate to supply a thresholdvoltage of said drive transistor into said holding capacitor prior tosaid sampling transistor sampling said input signal into said holdingcapacitor, wherein said first and second detection transistors areconfigured to be simultaneously on during at least a portion of a timeperiod prior to an emission period of said electro-optical element. 42.The active matrix apparatus according to claim 41, wherein said firstdetection transistor operates to provide a first reference potential ata first electrode of said holding capacitor.
 43. The active matrixapparatus according to claim 41, wherein said first detection transistoroperates to provide a first reference potential at a first electrode ofsaid holding capacitor and said second detection transistor operates toprovide a second reference potential at a second electrode of saidholding capacitor, and wherein the difference between said firstreference potential and said second reference potential is greater thanthe threshold voltage of said drive transistor.
 44. The active matrixapparatus according to claim 41, wherein current from the power supplypotential causes the voltage at a first electrode of said holdingcapacitor to increase until the difference between the voltage at saidfirst electrode of said holding capacitor and a second electrode of saidholding capacitor equals the threshold voltage of said drive transistor.45. The active matrix apparatus according to claim 41, wherein currentfrom the power supply potential causes the voltage at a first electrodeof said holding capacitor to increase until the difference between thevoltage at said first electrode of said holding capacitor and a secondelectrode of said holding capacitor becomes substantially equal to thethreshold voltage of said drive transistor.
 46. The active matrixapparatus according to claim 42, wherein said second detectiontransistor operates to provide a second reference potential at a secondelectrode of said holding capacitor.
 47. The active matrix apparatusaccording to claim 46, wherein current from the power supply potentialcauses the voltage at said first electrode of said holding capacitor toincrease until the difference between the voltage at said firstelectrode of said holding capacitor and said second electrode of saidholding capacitor equals the threshold voltage of said drive transistor.48. The active matrix apparatus according to claim 43, wherein saidelectro-optical element is connected between a source of said drivetransistor and a cathode potential, and wherein said first referencepotential, said second reference potential and said cathode potentialhave respective levels such that said increase in the voltage at saidfirst electrode of said holding capacitor occurs without causing saidelectro-optical element to be in an on state.
 49. The active matrixapparatus according to claim 44, wherein sampling said input signal intosaid holding capacitor comprises providing an input signal potential atsaid second electrode of said holding capacitor such that the voltagedifference between said first electrode of said holding capacitor andsaid second electrode of said holding capacitor becomes a sum of theinput signal potential and said threshold voltage of said drivingtransistor.
 50. The active matrix apparatus according to claim 44,wherein sampling said input signal into said holding capacitor comprisesproviding an input signal potential at said second electrode of saidholding capacitor such that the voltage difference between said firstelectrode of said holding capacitor and said second electrode of saidholding capacitor becomes substantially equal to a sum of the inputsignal potential and said threshold voltage of said driving transistor.51. A display apparatus, comprising: a plurality of scanning lines; aplurality of signal lines disposed perpendicularly to said scanninglines; and a plurality of pixels respectively disposed at intersectionsof said scanning lines and said signal lines, individual ones of saidplurality of pixels further comprising: an electro-optical element; aholding capacitor; a sampling transistor; a drive transistor; aswitching transistor; a first detection transistor; and a seconddetection transistor, wherein said sampling transistor samples an inputsignal from said signal line into said holding capacitor; said drivetransistor applies current to said electro-optical element depending onthe input signal held by said holding capacitor; said switchingtransistor supplies voltage of one of two electrodes of said holdingcapacitors to a gate of said driving transistor at on state; and saidfirst and second detection transistors operate to supply a thresholdvoltage of said drive transistor into said holding capacitor prior tosaid sampling transistor sampling said input signal into said holdingcapacitor. wherein said first and second detection transistors areconfigured to be simultaneously on during at least a portion of a timeperiod prior to an emission period of said electro-optical element. 52.The display apparatus according to claim 51, wherein said firstdetection transistor operates to provide a first reference potential ata first electrode of said holding capacitor.
 53. The display apparatusaccording to claim 51, wherein said first detection transistor operatesto provide a first reference potential at a first electrode of saidholding capacitor and said second detection transistor operates toprovide a second reference potential at a second electrode of saidholding capacitor, and wherein the difference between said firstreference potential and said second reference potential is greater thanthe threshold voltage of said drive transistor.
 54. The displayapparatus according to claim 51, wherein current from the power supplypotential causes the voltage at a first electrode of said holdingcapacitor to increase until the difference between the voltage at saidfirst electrode of said holding capacitor and a second electrode of saidholding capacitor equals the threshold voltage of said drive transistor.55. The display apparatus according to claim 51, wherein current fromthe power supply potential causes the voltage at a first electrode ofsaid holding capacitor to increase until the difference between thevoltage at said first electrode of said holding capacitor and a secondelectrode of said holding capacitor becomes substantially equal to thethreshold voltage of said drive transistor.
 56. The display apparatusaccording to claim 52, wherein said second detection transistor operatesto provide a second reference potential at a second electrode of saidholding capacitor.
 57. The display apparatus according to claim 56,wherein current from the power supply potential causes the voltage atsaid first electrode of said holding capacitor to increase until thedifference between the voltage at said first electrode of said holdingcapacitor and said second electrode of said holding capacitor equals thethreshold voltage of said drive transistor.
 58. The display apparatusaccording to claim 53, wherein said electro-optical element is connectedbetween a source of said drive transistor and a cathode potential, andwherein said first reference potential, said second reference potentialand said cathode potential have respective levels such that saidincrease in the voltage at said first electrode of said holdingcapacitor occurs without causing said electro-optical element to be inan on state.
 59. The display apparatus according to claim 54, whereinsampling said input signal into said holding capacitor comprisesproviding an input signal potential at said second electrode of saidholding capacitor such that the voltage difference between said firstelectrode of said holding capacitor and said second electrode of saidholding capacitor becomes a sum of the input signal potential and saidthreshold voltage of said driving transistor.
 60. The display apparatusaccording to claim 54, wherein sampling said input signal into saidholding capacitor comprises providing an input signal potential at saidsecond electrode of said holding capacitor such that the voltagedifference between said first electrode of said holding capacitor andsaid second electrode of said holding capacitor becomes substantiallyequal to a sum of the input signal potential and said threshold voltageof said driving transistor.
 61. For use in a pixel circuit disposed atan intersection of a scanning line and a signal line and comprising anelectro-optical element, a holding capacitor, a sampling transistor, adrive transistor, a switching transistor, a first detection transistor,and a second detection transistor, a method of drive transistorthreshold voltage compensation, the method comprising: sampling an inputsignal from said signal line into said holding capacitor; applyingcurrent to said electro-optical element depending on the input signalheld by said holding capacitor which holds a voltage between a sourceand a gate of said driving transistor; supplying current from a powersupply potential to said drive transistor; and operating said first andsecond detection transistors to supply a threshold voltage of said drivetransistor into said holding capacitor prior to sampling said inputsignal into said holding capacitor. wherein said first and seconddetection transistors are simultaneously on during at least a portion ofa time period prior to an emission period of said electro-opticalelement.
 62. The method according to claim 61, wherein said firstdetection transistor operates to provide a first reference potential ata first node of said holding capacitor.
 63. The method according toclaim 61, wherein said first detection transistor operates to provide afirst reference potential at a first node of said holding capacitor andsaid second detection transistor operates to provide a second referencepotential at a second node of said holding capacitor, and wherein thedifference between said first reference potential and said secondreference potential is greater than the threshold voltage of said drivetransistor.
 64. The method according to claim 61, wherein current fromthe power supply potential causes the voltage at a first node of saidholding capacitor to increase until the difference between the voltageat said first node of said holding capacitor and a second node of saidholding capacitor equals the threshold voltage of said drive transistor.65. The method according to claim 61, wherein current from the powersupply potential causes the voltage at a first node of said holdingcapacitor to increase until the difference between the voltage at saidfirst node of said holding capacitor and a second node of said holdingcapacitor becomes substantially equal to the threshold voltage of saiddrive transistor.
 66. The method according to claim 62, wherein saidsecond detection transistor operates to provide a second referencepotential at a second node of said holding capacitor.
 67. The methodaccording to claim 66, wherein current from the power supply potentialcauses the voltage at said first node of said holding capacitor toincrease until the difference between the voltage at said first node ofsaid holding capacitor and said second node of said holding capacitorequals the threshold voltage of said drive transistor.
 68. The methodaccording to claim 63, wherein said electro-optical element is connectedbetween a source of said drive transistor and a cathode potential, andwherein said first reference potential, said second reference potentialand said cathode potential have respective levels such that saidincrease in the voltage at said first node of said holding capacitoroccurs without causing said electro-optical element to be in an onstate.
 69. The method according to claim 64, wherein sampling said inputsignal into said holding capacitor comprises providing an input signalpotential at said second node of said holding capacitor such that thevoltage difference between said first node of said holding capacitor andsaid second node of said holding capacitor becomes a sum of the inputsignal potential and said threshold voltage of said driving transistor.70. The method according to claim 64, wherein sampling said input signalinto said holding capacitor comprises providing an input signalpotential at said second node of said holding capacitor such that thevoltage difference between said first node of said holding capacitor andsaid second node of said holding capacitor becomes substantially equalto a sum of the input signal potential and said threshold voltage ofsaid driving transistor.
 71. For use in a pixel circuit disposed at anintersection of a scanning line and a signal line and comprising anelectro-optical element, a holding capacitor, a sampling transistor, adrive transistor, a switching transistor, a first detection transistor,and a second detection transistor, a method of drive transistorthreshold voltage compensation, the method comprising: sampling an inputsignal from said signal line into said holding capacitor; applyingcurrent to said electro-optical element depending on the input signalheld by said holding capacitor; said switching transistor suppliesvoltage of one of two electrodes of said holding capacitor to a gate ofsaid driving transistor at on state; and operating said first and seconddetection transistors to supply a threshold voltage of said drivetransistor into said holding capacitor prior to sampling said inputsignal into said holding capacitor. wherein said first and seconddetection transistors are simultaneously on during at least a portion ofa time period prior to an emission period of said electro-opticalelement.
 72. The method according to claim 71, wherein said firstdetection transistor operates to provide a first reference potential ata first electrode of said holding capacitor.
 73. The method according toclaim 71, wherein said first detection transistor operates to provide afirst reference potential at a first electrode of said holding capacitorand said second detection transistor operates to provide a secondreference potential at a second electrode of said holding capacitor, andwherein the difference between said first reference potential and saidsecond reference potential is greater than the threshold voltage of saiddrive transistor.
 74. The method according to claim 71, wherein currentfrom the power supply potential causes the voltage at a first electrodeof said holding capacitor to increase until the difference between thevoltage at said first electrode of said holding capacitor and a secondelectrode of said holding capacitor equals the threshold voltage of saiddrive transistor.
 75. The method according to claim 71, wherein currentfrom the power supply potential causes the voltage at a first electrodeof said holding capacitor to increase until the difference between thevoltage at said first electrode of said holding capacitor and a secondelectrode of said holding capacitor becomes substantially equal to thethreshold voltage of said drive transistor.
 76. The method according toclaim 72, wherein said second detection transistor operates to provide asecond reference potential at a second electrode of said holdingcapacitor.
 77. The method according to claim 76, wherein current fromthe power supply potential causes the voltage at said first electrode ofsaid holding capacitor to increase until the difference between thevoltage at said first electrode of said holding capacitor and saidsecond electrode of said holding capacitor equals the threshold voltageof said drive transistor.
 78. The method according to claim 73, whereinsaid electro-optical element is connected between a source of said drivetransistor and a cathode potential, and wherein said first referencepotential, said second reference potential and said cathode potentialhave respective levels such that said increase in the voltage at saidfirst electrode of said holding capacitor occurs without causing saidelectro-optical element to be in an on state.
 79. The method accordingto claim 74, wherein sampling said input signal into said holdingcapacitor comprises providing an input signal potential at said secondelectrode of said holding capacitor such that the voltage differencebetween said first electrode of said holding capacitor and said secondelectrode of said holding capacitor becomes a sum of the input signalpotential and said threshold voltage of said driving transistor.
 80. Themethod according to claim 74, wherein sampling said input signal intosaid holding capacitor comprises providing an input signal potential atsaid second electrode of said holding capacitor such that the voltagedifference between said first electrode of said holding capacitor andsaid second electrode of said holding capacitor becomes substantiallyequal to a sum of the input signal potential and said threshold voltageof said driving transistor.